Characterization (materials science)

<h2 id="microscopy">Microscopy</h2>

<p><a href="/facts/Microscopy/GpHlElDS">Microscopy</a> is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use <a href="/facts/Photon/mFNhAEzA">photons</a>, <a href="/facts/Electron/L0KBo5cW">electrons</a>, <a href="/facts/Ion/3bePpDna">ions</a> or physical cantilever probes to gather data about a sample's structure on a range of length scales. Some common examples of microscopy techniques include:
</p>
<ul><li><a href="/facts/Optical_microscopy/5700vcna">Optical microscopy</a></li>
<li><a href="/facts/Scanning_electron_microscopy/yzK0hsSx">Scanning electron microscopy</a> (SEM)</li>
<li><a href="/facts/Transmission_electron_microscopy/Rpr8jpCn">Transmission electron microscopy</a> (TEM)</li>
<li><a href="/facts/Field_ion_microscopy/fcKGquVT">Field ion microscopy</a> (FIM)</li>
<li><a href="/facts/Scanning_probe_microscopy/uJJPXQLN">Scanning probe microscopy</a> (SPM)
<ul><li><a href="/facts/Atomic_force_microscopy/JDbdsvdy">Atomic force microscopy</a> (AFM)</li>
<li><a href="/facts/Scanning_tunneling_microscopy/LQ4BzmwP">Scanning tunneling microscopy</a> (STM)</li></ul></li>
<li><a href="/facts/Diffraction_topography/HaydrzKb">X-ray diffraction topography</a> (XRT)</li>
<li><a href="/facts/Atom_probe/Pdw7NIrU">Atom-Probe Tomography</a> (APT)</li></ul>
<h2 id="spectroscopy">Spectroscopy</h2>
<p><a href="/facts/Spectroscopy/mj71FuNK">Spectroscopy</a> is a category of characterization techniques which use a range of principles to reveal the chemical composition, composition variation, crystal structure and photoelectric properties of materials. Some common examples of spectroscopy techniques include:
</p>
<h3>Optical radiation</h3>
<ul><li><a href="/facts/Ultraviolet-visible_spectroscopy/MUPLLczo">Ultraviolet-visible spectroscopy</a> (UV-vis)</li>
<li><a href="/facts/Fourier_transform_infrared_spectroscopy/G9UscTuA">Fourier transform infrared spectroscopy</a> (FTIR)</li>
<li><a href="/facts/Thermoluminescence/v8qxKI1n">Thermoluminescence</a> (TL)</li>
<li><a href="/facts/Photoluminescence/L1u2PJIa">Photoluminescence</a> (PL)</li></ul>
<h3>X-ray</h3>

<ul><li><a href="/facts/X-ray_crystallography/WtI0F5DN">X-ray diffraction</a> (XRD)</li>
<li><a href="/facts/Small-angle_X-ray_scattering/Q4tvaRn7">Small-angle X-ray scattering</a> (SAXS)</li>
<li><a href="/facts/Energy-dispersive_X-ray_spectroscopy/GW0BSTKF">Energy-dispersive X-ray spectroscopy</a> (EDX, EDS)</li>
<li><a href="/facts/Wavelength_dispersive_X-ray_spectroscopy/LR3PnXto">Wavelength dispersive X-ray spectroscopy</a> (WDX, WDS)</li>
<li><a href="/facts/Electron_energy_loss_spectroscopy/jLd6sMUb">Electron energy loss spectroscopy</a> (EELS)</li>
<li><a href="/facts/X-ray_photoelectron_spectroscopy/dkhwnmcQ">X-ray photoelectron spectroscopy</a> (XPS)</li>
<li><a href="/facts/Auger_electron_spectroscopy/GTcxGXrA">Auger electron spectroscopy</a> (AES)</li>
<li><a href="/facts/X-ray_photon_correlation_spectroscopy/UJjxhJJw">X-ray photon correlation spectroscopy</a> (XPCS)<a class="footnote-ref" id="fnref:7" href="#fn:7"><sup>7</sup></a></li></ul>
<h3>Mass spectrometry</h3>
<p class="note">Further information: <a href="/facts/Mass_spectrometry/RH5WBHJ2">Mass spectrometry</a></p>
<ul><li>Modes of mass spectrometry:
<ul><li><a href="/facts/Electron_ionization/rTJKHm5z">Electron ionization</a> (EI)</li>
<li><a href="/facts/Thermal_ionization_mass_spectrometry/11PUrL2T">Thermal ionization mass spectrometry</a> (TI-MS)</li>
<li><a href="/facts/MALDI-TOF/nBBXfb2Q">MALDI-TOF</a></li></ul></li>
<li><a href="/facts/Secondary_ion_mass_spectrometry/8JNqxqP6">Secondary ion mass spectrometry</a> (SIMS)</li></ul>
<h3>Nuclear spectroscopy</h3>
<p class="note">Further information: <a href="/facts/Nuclear_spectroscopy/wGIS5IGq">Nuclear spectroscopy</a></p>

<ul><li><a href="/facts/Nuclear_magnetic_resonance_spectroscopy/SFKgdthI">Nuclear magnetic resonance spectroscopy</a> (NMR)</li>
<li><a href="/facts/M%25C3%25B6ssbauer_spectroscopy/GIhmBXL6">Mössbauer spectroscopy</a> (MBS)</li>
<li><a href="/facts/Perturbed_angular_correlation/BE5K5ebF">Perturbed angular correlation</a> (PAC)</li></ul>
<h3>Other</h3>
<ul><li><a href="/facts/Photon_correlation_spectroscopy/dAJRM90w">Photon correlation spectroscopy</a>/<a href="/facts/Dynamic_light_scattering/dAJRM90w">Dynamic light scattering</a> (DLS)</li>
<li><a href="/facts/Terahertz_spectroscopy_and_technology/BjHegorH">Terahertz spectroscopy</a> (THz)</li>
<li><a href="/facts/Electron_paramagnetic_resonance/TDHV8c9e">Electron paramagnetic/spin resonance</a> (EPR, ESR)</li>
<li><a href="/facts/Small-angle_neutron_scattering/DmT7HvQN">Small-angle neutron scattering</a> (SANS)</li>
<li><a href="/facts/Rutherford_backscattering_spectrometry/ReFUhwDe">Rutherford backscattering spectrometry</a> (RBS)</li>
<li>Spatially resolved acoustic spectroscopy (<a href="/facts/SRAS/5HIDYMHa">SRAS</a>)</li></ul>
<h2 id="macroscopic-testing">Macroscopic testing</h2>
<p>A huge range of techniques are used to characterize various macroscopic properties of materials, including:
</p>
<ul><li><a href="/facts/Mechanical_testing/zPN6yqNT">Mechanical testing</a>, including tensile, compressive, torsional, creep, fatigue, toughness and hardness testing</li>
<li><a href="/facts/Differential_thermal_analysis/yI17sP8S">Differential thermal analysis</a> (DTA)</li>
<li><a href="/facts/Dielectric_thermal_analysis/6WHcgszY">Dielectric thermal analysis</a> (DEA, DETA)</li>
<li><a href="/facts/Thermogravimetric_analysis/t3hdEok7">Thermogravimetric analysis</a> (TGA)</li>
<li><a href="/facts/Differential_scanning_calorimetry/Gj9u8Plc">Differential scanning calorimetry</a> (DSC)</li>
<li><a href="/facts/Impulse_excitation_technique/bTzDk4w0">Impulse excitation technique</a> (IET)</li>
<li><a href="/facts/Ultrasound/31Pa5IH9">Ultrasound</a> techniques, including <a href="/facts/Resonant_ultrasound_spectroscopy/h74hmIca">resonant ultrasound spectroscopy</a> and time domain <a href="/facts/Ultrasonic_testing/MNBrJjuP">ultrasonic testing</a> methods<a class="footnote-ref" id="fnref:8" href="#fn:8"><sup>8</sup></a></li></ul>

<h2 id="see-also">See also</h2>
<ul><li><a href="/facts/Analytical_chemistry/MHQf3YP6">Analytical chemistry</a></li>
<li><a href="/facts/Instrumental_chemistry/AFVUB1Ac">Instrumental chemistry</a></li>
<li><a href="/facts/Semiconductor_characterization_techniques/Q28PqCFj">Semiconductor characterization techniques</a></li>
<li><a href="/facts/Wafer_bond_characterization/1F9dPahC">Wafer bond characterization</a></li>
<li><a href="/facts/Polymer_characterization/HoaKXk46">Polymer characterization</a></li>
<li><a href="/facts/Lipid_bilayer_characterization/dRRj68Aq">Lipid bilayer characterization</a></li>
<li><a href="/facts/Lignin_characterization/CNJLD1Pl">Lignin characterization</a></li>
<li><a href="/facts/Characterization_of_nanoparticles/PorQ0vax">Characterization of nanoparticles</a></li>
<li><a href="/facts/MEMS_for_in_situ_mechanical_characterization/2Kp6QrzL">MEMS for in situ mechanical characterization</a></li></ul>

<h2 id="references">References</h2>

<ol>
<li id="fn:1"><p>Kumar, Sam Zhang, Lin Li, Ashok (2009). Materials characterization techniques. Boca Raton: CRC Press. ISBN 978-1420042948.{{cite book}}:  CS1 maint: multiple names: authors list (link) <a href="978-1420042948" target="_blank">978-1420042948</a> <a href="#fnref:1" class="footnote-back-ref">↩</a></p></li>
<li id="fn:2"><p>Leng, Yang (2009). Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. Wiley. ISBN 978-0-470-82299-9. <a href="978-0-470-82299-9" target="_blank">978-0-470-82299-9</a> <a href="#fnref:2" class="footnote-back-ref">↩</a></p></li>
<li id="fn:3"><p>Leng, Yang (2009). Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. Wiley. ISBN 978-0-470-82299-9. <a href="978-0-470-82299-9" target="_blank">978-0-470-82299-9</a> <a href="#fnref:3" class="footnote-back-ref">↩</a></p></li>
<li id="fn:4"><p>Zhang, Sam (2008). Materials Characterization Techniques. CRC Press. ISBN 978-1420042948. <a href="978-1420042948" target="_blank">978-1420042948</a> <a href="#fnref:4" class="footnote-back-ref">↩</a></p></li>
<li id="fn:5"><p>Mathys, Daniel, Zentrum für Mikroskopie, University of Basel: Die Entwicklung der Elektronenmikroskopie vom Bild über die Analyse zum Nanolabor, p. 8 <a href="/wiki/University_of_Basel" target="_blank">/wiki/University_of_Basel</a> <a href="#fnref:5" class="footnote-back-ref">↩</a></p></li>
<li id="fn:6"><p>Patent US4724318 – Atomic force microscope and method for imaging surfaces with atomic resolution – Google Patents <a href="https://patents.google.com/patent/US4724318?oq=4724318" target="_blank">https://patents.google.com/patent/US4724318?oq=4724318</a> <a href="#fnref:6" class="footnote-back-ref">↩</a></p></li>
<li id="fn:7"><p>"What is X-ray Photon Correlation Spectroscopy (XPCS)?". sector7.xray.aps.anl.gov. Archived from the original on 2018-08-22. Retrieved 2016-10-29. <a href="https://web.archive.org/web/20180822154851/http://sector7.xray.aps.anl.gov/~dufresne/UofM/xpcs.html" target="_blank">https://web.archive.org/web/20180822154851/http://sector7.xray.aps.anl.gov/~dufresne/UofM/xpcs.html</a> <a href="#fnref:7" class="footnote-back-ref">↩</a></p></li>
<li id="fn:8"><p>R. Truell, C. Elbaum and C.B. Chick., Ultrasonic methods in solid state physics  New York, Academic Press Inc., 1969. <a href="#fnref:8" class="footnote-back-ref">↩</a></p></li>
</ol>

Characterization (materials science) open-in-new

Characterization (materials science)