Feature-oriented scanning

<h2 id="topography">Topography</h2>
Any topography element that looks like a hill or a pit in wide sense may be taken as a surface feature. Examples of surface features (objects) are: <a href="/facts/Atom/FoQ4kGN5">atoms</a>, interstices, <a href="/facts/Molecule/N9ljSfFq">molecules</a>, <a href="/facts/Crystallite/nXSgR0wp">grains</a>, <a href="/facts/Nanoparticle/k8kNxX4E">nanoparticles</a>, clusters, <a href="/facts/Crystallite/nXSgR0wp">crystallites</a>, <a href="/facts/Quantum_dot/K5Ytv8Yw">quantum dots</a>, nanoislets, pillars, pores, short <a href="/facts/Nanowire/Ege0K9Ek">nanowires</a>, short nanorods, short <a href="/facts/Nanotube/UcEkk6Xn">nanotubes</a>, <a href="/facts/Virus/mf88Bcbl">viruses</a>, <a href="/facts/Bacterium/wC8xSCsU">bacteria</a>, <a href="/facts/Organelle/vhDFnGbs">organelles</a>, <a href="/facts/Cell_(biology)/bLM9UQvy">cells</a>, etc.
FOS is designed for high-precision measurement of surface topography (see Fig.) as well as other surface properties and characteristics. Moreover, in comparison with the conventional scanning, FOS allows obtaining a higher spatial resolution. Thanks to a number of techniques embedded in FOS, the distortions caused by thermal drifts and <a href="/facts/Creep_(deformation)/6GtcMsBt">creeps</a> are practically eliminated.

<h2 id="applications">Applications</h2>
FOS has the following fields of application: surface <a href="/facts/Metrology/HC0MmLdb">metrology</a>, precise probe positioning, automatic surface characterization, automatic surface modification/stimulation, automatic manipulation of nanoobjects, nanotechnological processes of “bottom-up” assembly, coordinated control of analytical and technological probes in multiprobe instruments, control of <a href="/facts/Molecular_assembler/QmxNpVR6">atomic/molecular assemblers</a>, control of probe nanolithographs, etc.

<h2 id="see-also">See also</h2>
<ul><li><a href="/facts/Counter-scanning/wWl1B8er">Counter-scanning</a></li>
<li><a href="/facts/Feature-oriented_positioning/aFBlN2AR">Feature-oriented positioning</a></li></ul>

1. R. V. Lapshin (2004). <a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Feature-oriented%20scanning%20methodology%20for%20probe%20microscopy%20and%20nanotechnology.pdf">"Feature-oriented scanning methodology for probe microscopy and nanotechnology"</a> (PDF). Nanotechnology. 15 (9). UK: IOP: 1135–1151. <a href="/facts/Bibcode_(identifier)/9HtdQSGB">Bibcode</a>:<a href="https://ui.adsabs.harvard.edu/abs/2004Nanot..15.1135L">2004Nanot..15.1135L</a>. <a href="/facts/Doi_(identifier)/muM9Etpq">doi</a>:<a href="https://doi.org/10.1088%2F0957-4484%2F15%2F9%2F006">10.1088/0957-4484/15/9/006</a>. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/0957-4484">0957-4484</a>. <a href="/facts/S2CID_(identifier)/ldJsHa2Y">S2CID</a> <a href="https://api.semanticscholar.org/CorpusID:250913438">250913438</a>. (<a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Feature-oriented%20scanning%20methodology%20for%20probe%20microscopy%20and%20nanotechnology.ru.pdf">Russian translation</a> is available).
2. R. V. Lapshin (2007). <a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Automatic%20drift%20elimination%20in%20probe%20microscope%20images%20based%20on%20techniques%20of%20counter-scanning%20and%20topography%20feature%20recognition.pdf">"Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition"</a> (PDF). Measurement Science and Technology. 18 (3). UK: IOP: 907–927. <a href="/facts/Bibcode_(identifier)/9HtdQSGB">Bibcode</a>:<a href="https://ui.adsabs.harvard.edu/abs/2007MeScT..18..907L">2007MeScT..18..907L</a>. <a href="/facts/Doi_(identifier)/muM9Etpq">doi</a>:<a href="https://doi.org/10.1088%2F0957-0233%2F18%2F3%2F046">10.1088/0957-0233/18/3/046</a>. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/0957-0233">0957-0233</a>. <a href="/facts/S2CID_(identifier)/ldJsHa2Y">S2CID</a> <a href="https://api.semanticscholar.org/CorpusID:121988564">121988564</a>. (<a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Automatic%20drift%20elimination%20in%20probe%20microscope%20images%20based%20on%20techniques%20of%20counter-scanning%20and%20topography%20feature%20recognition.ru.pdf">Russian translation</a> is available).
3. R. V. Lapshin (2011). <a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Feature-oriented%20scanning%20probe%20microscopy.pdf">"Feature-oriented scanning probe microscopy"</a> (PDF). In H. S. Nalwa (ed.). Encyclopedia of Nanoscience and Nanotechnology. Vol. 14. USA: American Scientific Publishers. pp. 105–115. <a href="/facts/ISBN_(identifier)/15AdSPa9">ISBN</a> 978-1-58883-163-7.
4. R. Lapshin (2014). <a href="http://www.electronics.ru/journal/article/4748">"Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies"</a>. Electronics: Science, Technology, Business (Special issue “50 years of the Institute of Physical Problems”). Russian Federation: Technosphera Publishers: 94–106. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/1992-4178">1992-4178</a>. (in Russian).
5. R. V. Lapshin (2015). <a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Drift-insensitive%20distributed%20calibration%20of%20probe%20microscope%20scanner%20in%20nanometer%20range%20Approach%20description.pdf">"Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description"</a> (PDF). Applied Surface Science. 359. Netherlands: Elsevier B. V.: 629–636. <a href="/facts/ArXiv_(identifier)/H6EtgnBe">arXiv</a>:<a href="https://arxiv.org/abs/1501.05545">1501.05545</a>. <a href="/facts/Bibcode_(identifier)/9HtdQSGB">Bibcode</a>:<a href="https://ui.adsabs.harvard.edu/abs/2015ApSS..359..629L">2015ApSS..359..629L</a>. <a href="/facts/Doi_(identifier)/muM9Etpq">doi</a>:<a href="https://doi.org/10.1016%2Fj.apsusc.2015.10.108">10.1016/j.apsusc.2015.10.108</a>. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/0169-4332">0169-4332</a>. <a href="/facts/S2CID_(identifier)/ldJsHa2Y">S2CID</a> <a href="https://api.semanticscholar.org/CorpusID:118434225">118434225</a>.
6. R. V. Lapshin (2016). <a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Drift-insensitive%20distributed%20calibration%20of%20probe%20microscope%20scanner%20in%20nanometer%20range%20Virtual%20mode.pdf">"Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode"</a> (PDF). Applied Surface Science. 378. Netherlands: Elsevier B. V.: 530–539. <a href="/facts/ArXiv_(identifier)/H6EtgnBe">arXiv</a>:<a href="https://arxiv.org/abs/1501.05726">1501.05726</a>. <a href="/facts/Bibcode_(identifier)/9HtdQSGB">Bibcode</a>:<a href="https://ui.adsabs.harvard.edu/abs/2016ApSS..378..530L">2016ApSS..378..530L</a>. <a href="/facts/Doi_(identifier)/muM9Etpq">doi</a>:<a href="https://doi.org/10.1016%2Fj.apsusc.2016.03.201">10.1016/j.apsusc.2016.03.201</a>. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/0169-4332">0169-4332</a>. <a href="/facts/S2CID_(identifier)/ldJsHa2Y">S2CID</a> <a href="https://api.semanticscholar.org/CorpusID:119191299">119191299</a>.
7. R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode". Applied Surface Science. 470. Netherlands: Elsevier B. V.: 1122–1129. <a href="/facts/ArXiv_(identifier)/H6EtgnBe">arXiv</a>:<a href="https://arxiv.org/abs/1501.06679">1501.06679</a>. <a href="/facts/Bibcode_(identifier)/9HtdQSGB">Bibcode</a>:<a href="https://ui.adsabs.harvard.edu/abs/2019ApSS..470.1122L">2019ApSS..470.1122L</a>. <a href="/facts/Doi_(identifier)/muM9Etpq">doi</a>:<a href="https://doi.org/10.1016%2Fj.apsusc.2018.10.149">10.1016/j.apsusc.2018.10.149</a>. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/0169-4332">0169-4332</a>. <a href="/facts/S2CID_(identifier)/ldJsHa2Y">S2CID</a> <a href="https://api.semanticscholar.org/CorpusID:119275633">119275633</a>.
8. R. V. Lapshin (2009). <a href="http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Availability%20of%20feature-oriented%20scanning%20probe%20microscopy%20for%20remote-controlled%20measurements%20on%20board%20a%20space%20laboratory%20or%20planet%20exploration%20rover.pdf">"Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover"</a> (PDF). Astrobiology. 9 (5). USA: Mary Ann Liebert: 437–442. <a href="/facts/Bibcode_(identifier)/9HtdQSGB">Bibcode</a>:<a href="https://ui.adsabs.harvard.edu/abs/2009AsBio...9..437L">2009AsBio...9..437L</a>. <a href="/facts/Doi_(identifier)/muM9Etpq">doi</a>:<a href="https://doi.org/10.1089%2Fast.2007.0173">10.1089/ast.2007.0173</a>. <a href="/facts/ISSN_(identifier)/DPAflDvU">ISSN</a> <a href="https://search.worldcat.org/issn/1531-1074">1531-1074</a>. <a href="/facts/PMID_(identifier)/JlHAvMHt">PMID</a> <a href="https://pubmed.ncbi.nlm.nih.gov/19566423">19566423</a>.
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<h2 id="external-links">External links</h2>
<ul><li><a href="http://www.lapshin.fast-page.org/research.htm#fos1996">Feature-oriented scanning</a>, Research section, Lapshin's Personal Page on SPM & Nanotechnology</li></ul>

Feature-oriented scanning open-in-new

Feature-oriented scanning