In IXS the energy and angle of inelastically scattered X-rays are monitored, giving the dynamic structure factor S ( q , ω ) {\displaystyle S(\mathbf {q} ,\omega )} . From this many properties of materials can be obtained, the specific property depending on the scale of the energy transfer. The table below, listing techniques, is adapted from.2 Inelastically scattered X-rays have intermediate phases and so in principle are not useful for X-ray crystallography. In practice X-rays with small energy transfers are included with the diffraction spots due to elastic scattering, and X-rays with large energy transfers contribute to the background noise in the diffraction pattern.
Guinier, A. (1963). X-ray diffraction in Crystals, Imperfect Crystals and Amorphous Bodies. San Francisco: W.H. Freeman & Co. ↩
Baron, Alfred Q. R (2015). "Introduction to High-Resolution Inelastic X-Ray Scattering". arXiv:1504.01098 [cond-mat.mtrl-sci]. /wiki/ArXiv_(identifier) ↩