The hybrid-pi model is a linearized two-port network approximation to the BJT using the small-signal base-emitter voltage, v be {\displaystyle \textstyle v_{\text{be}}} , and collector-emitter voltage, v ce {\displaystyle \textstyle v_{\text{ce}}} , as independent variables, and the small-signal base current, i b {\displaystyle \textstyle i_{\text{b}}} , and collector current, i c {\displaystyle \textstyle i_{\text{c}}} , as dependent variables.2
A basic, low-frequency hybrid-pi model for the bipolar transistor is shown in figure 1. The various parameters are as follows.
is the transconductance, evaluated in a simple model,3 where:
where:
The output conductance, gce, is the reciprocal of the output resistance, ro:
The transresistance, rm, is the reciprocal of the transconductance:
The full model introduces the virtual terminal, B′, so that the base spreading resistance, rbb, (the bulk resistance between the base contact and the active region of the base under the emitter) and rb′e (representing the base current required to make up for recombination of minority carriers in the base region) can be represented separately. Ce is the diffusion capacitance representing minority carrier storage in the base. The feedback components, rb′c and Cc, are introduced to represent the Early effect and Miller effect, respectively.4
A basic, low-frequency hybrid-pi model for the MOSFET is shown in figure 2. The various parameters are as follows.
is the transconductance, evaluated in the Shichman–Hodges model in terms of the Q-point drain current, I D {\displaystyle \scriptstyle I_{\text{D}}} :5
The combination:
is often called overdrive voltage.
is the output resistance due to channel length modulation, calculated using the Shichman–Hodges model as
using the approximation for the channel length modulation parameter, λ:6
Here VE is a technology-related parameter (about 4 V/μm for the 65 nm technology node7) and L is the length of the source-to-drain separation.
The drain conductance is the reciprocal of the output resistance:
Giacoletto, L.J. "Diode and transistor equivalent circuits for transient operation" IEEE Journal of Solid-State Circuits, Vol 4, Issue 2, 1969 [1] https://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=1049963&contentType=Journals+%26+Magazines&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A22508%29 ↩
R.C. Jaeger and T.N. Blalock (2004). Microelectronic Circuit Design (Second ed.). New York: McGraw-Hill. pp. Section 13.5, esp. Eqs. 13.19. ISBN 978-0-07-232099-2. 978-0-07-232099-2 ↩
R.C. Jaeger and T.N. Blalock (2004). Eq. 5.45 pp. 242 and Eq. 13.25 p. 682. McGraw-Hill. ISBN 978-0-07-232099-2. 978-0-07-232099-2 ↩
Dhaarma Raj Cheruku, Battula Tirumala Krishna, Electronic Devices And Circuits, pages 281-282, Pearson Education India, 2008 ISBN 8131700984. /wiki/ISBN_(identifier) ↩
R.C. Jaeger and T.N. Blalock (2004). Eq. 4.20 pp. 155 and Eq. 13.74 p. 702. McGraw-Hill. ISBN 978-0-07-232099-2. 978-0-07-232099-2 ↩
W. M. C. Sansen (2006). Analog Design Essentials. Dordrechtμ: Springer. p. §0124, p. 13. ISBN 978-0-387-25746-4. 978-0-387-25746-4 ↩