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Feature-oriented positioning
open-in-new
<h2 id="see-also">See also</h2> <ul><li><a href="/facts/Feature-oriented_scanning/Ufcguaky">Feature-oriented scanning</a></li></ul> <h2 id="external-links">External links</h2> <ul><li><a href="http://www.lapshin.fast-page.org/research.htm#fop1996">Feature-oriented positioning</a>, Research section, Lapshin's Personal Page on SPM & Nanotechnology</li></ul> <h2 id="references">References</h2> <ol> <li id="fn:1"><p>R. V. Lapshin (2004). "Feature-oriented scanning methodology for probe microscopy and nanotechnology" (PDF). Nanotechnology. 15 (9). UK: IOP: 1135–1151. Bibcode:2004Nanot..15.1135L. doi:10.1088/0957-4484/15/9/006. ISSN 0957-4484. <a href="http://www.nanoworld.org/homepages/lapshin/publications.htm#feature2004" target="_blank">http://www.nanoworld.org/homepages/lapshin/publications.htm#feature2004</a> <a href="#fnref:1" class="footnote-back-ref">↩</a></p></li> <li id="fn:2"><p>R. V. Lapshin (2011). "Feature-oriented scanning probe microscopy". In H. S. Nalwa (ed.). Encyclopedia of Nanoscience and Nanotechnology (PDF). Vol. 14. USA: American Scientific Publishers. pp. 105–115. ISBN 978-1-58883-163-7. <a href="978-1-58883-163-7" target="_blank">978-1-58883-163-7</a> <a href="#fnref:2" class="footnote-back-ref">↩</a></p></li> <li id="fn:3"><p>R. Lapshin (2014). "Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies" (PDF). Electronics: Science, Technology, Business (Special issue “50 years of the Institute of Physical Problems”). Russian Federation: Technosphera Publishers: 94–106. ISSN 1992-4178. (in Russian). <a href="http://www.lapshin.fast-page.org/publications.htm#feature2014" target="_blank">http://www.lapshin.fast-page.org/publications.htm#feature2014</a> <a href="#fnref:3" class="footnote-back-ref">↩</a></p></li> <li id="fn:4"><p>D. W. Pohl, R. Möller (1988). ""Tracking" tunneling microscopy". Review of Scientific Instruments. 59 (6). USA: AIP Publishing: 840–842. Bibcode:1988RScI...59..840P. doi:10.1063/1.1139790. ISSN 0034-6748. <a href="/wiki/Bibcode_(identifier)" target="_blank">/wiki/Bibcode_(identifier)</a> <a href="#fnref:4" class="footnote-back-ref">↩</a></p></li> <li id="fn:5"><p>B. S. Swartzentruber (1996). "Direct measurement of surface diffusion using atom-tracking scanning tunneling microscopy". Physical Review Letters. 76 (3). USA: American Physical Society: 459–462. Bibcode:1996PhRvL..76..459S. doi:10.1103/PhysRevLett.76.459. ISSN 0031-9007. PMID 10061462. <a href="https://zenodo.org/record/1233907" target="_blank">https://zenodo.org/record/1233907</a> <a href="#fnref:5" class="footnote-back-ref">↩</a></p></li> </ol>