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Bead probe technology
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<p>Bead probe technology (BPT) is technique used to provide electrical access (called “nodal access”) to <a href="/facts/Printed_circuit_board/muSR2p43">printed circuit board</a> (PCB) circuitry for performing <a href="/facts/In-circuit_test/vc5Dyz2w"> in-circuit testing (ICT)</a>. It makes use of small beads of <a href="/facts/Solder/GBvJH75t">solder</a> placed onto the board's <a href="/facts/Printed_circuit_board/muSR2p43">traces</a> to allow measuring and controlling of the signals using a test probe. This permits test access to boards on which standard ICT test pads are not feasible due to space constraints. </p>