X-ray diffraction computed tomography

X-ray diffraction computed tomography is an experimental technique that combines <a href="/facts/X-ray_crystallography/WtI0F5DN">X-ray diffraction</a> with the <a href="/facts/CT_scan/NusPJ2S8">computed tomography</a> data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. using a laboratory <a href="/facts/Diffractometer/c2U1CNRH">diffractometer</a> and a <a href="/facts/Monochromatic_radiation/5bzKwIH3">monochromatic</a> <a href="/facts/X-ray/wseP79cN">X-ray</a> <a href="/facts/Pencil_beam/wQtPHxsa">pencil beam</a>. The first implementation of the technique at <a href="/facts/Synchrotron/J1oWBgbU">synchrotron</a> facilities was performed in 1998 by Kleuker et al.
X-ray diffraction computed tomography can be divided into two main categories depending on how the XRD data are being treated, specifically the XRD data can be treated either as <a href="/facts/Powder_diffraction/y5uDg49u">powder diffraction</a> or <a href="/facts/X-ray_crystallography/WtI0F5DN">single crystal diffraction</a> data and this depends on the sample properties. If the sample contains small and randomly oriented crystals, then it generates smooth <a href="/facts/Powder_diffraction/y5uDg49u">powder diffraction</a> "rings" when using a 2D area detector. If the sample contains large crystals, then it generates "spotty" 2D diffraction patterns. The latter can be performed using also a letterbox, cone and parallel X-ray beam and yields 2D or 3D images corresponding to maps of the <a href="/facts/Crystallites/nXSgR0wp">crystallites</a> or "grains" present in the sample and their properties, such as <a href="/facts/Stress_(mechanics)/ErAXDbbd">stress</a> or <a href="/facts/Strain_(mechanics)/xK7R59oI">strain</a>. There exist several variations of this approach including <a href="/facts/Three-dimensional_X-ray_diffraction/jTDutzpo">3DXRD</a>, X-ray diffraction contrast tomography (DCT) and high energy X-ray diffraction microscopy (HEDM)
X-ray diffraction computed tomography, often abbreviated as XRD-CT, typically refers to the technique invented by Harding et al. which assumes that the acquired data are <a href="/facts/Powder_diffraction/y5uDg49u">powder diffraction</a> data. For this reason, it has also been mentioned as powder diffraction computed tomography and diffraction scattering computed tomography (DSCT), however they both refer to the same method.

X-ray diffraction computed tomography open-in-new

X-ray diffraction computed tomography