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Reference.org
Wavelength-dispersive X-ray spectroscopy
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<p>Wavelength-dispersive X-ray spectroscopy (WDXS or WDS) is a non-destructive analysis technique used to obtain elemental information about a range of materials by measuring characteristic x-rays within a small wavelength range. The technique generates a <a href="/facts/Spectrum/wPUjkpqI">spectrum</a> in which the peaks correspond to specific x-ray lines, and elements can be easily identified. WDS is primarily used in chemical analysis, wavelength dispersive <a href="/facts/X-ray_fluorescence/eIUz3wwS">X-ray fluorescence</a> (WDXRF) <a href="/facts/Spectrometer/IqRE8xaQ">spectrometry</a>, <a href="/facts/Electron_microprobe/JGw1T6YV">electron microprobes</a>, <a href="/facts/Scanning_electron_microscope/yzK0hsSx">scanning electron microscopes</a>, and high-precision experiments for testing atomic and plasma physics. </p>