Kelvin probe force microscope

<p>Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of <a href="/facts/Atomic_force_microscopy/JDbdsvdy">atomic force microscopy</a> (AFM). By <a href="/facts/Raster_scanning/wl7UBw02">raster scanning</a> in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure <a href="/facts/Corrosion/lIC7H4we">corrosion</a> and <a href="/facts/Coating/fGt3R3VC">coatings</a>.
</p><p>With KPFM, the <a href="/facts/Work_function/VHaHTyXg">work function</a> of surfaces can be observed at <a href="/facts/Atom/FoQ4kGN5">atomic</a> or <a href="/facts/Molecule/N9ljSfFq">molecular</a> scales. The work function relates to many surface phenomena, including <a href="/facts/Catalysis/LPBS7TQC">catalytic activity</a>, reconstruction of surfaces, doping and band-bending of <a href="/facts/Semiconductor/zFf3mGTE">semiconductors</a>, charge trapping in <a href="/facts/Dielectric/PnVt9P2G">dielectrics</a> and <a href="/facts/Corrosion/lIC7H4we">corrosion</a>. The map of the work function produced by KPFM gives information about the composition and electronic state of the local structures on the surface of a solid.
</p>

Kelvin probe force microscope open-in-new

Kelvin probe force microscope