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Semiconductor characterization techniques
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<p>Semiconductor characterization techniques are used to <a href="/facts/Characterization_(materials_science)/FDzNl7B7">characterize</a> a <a href="/facts/Semiconductor_material/zFf3mGTE">semiconductor material</a> or <a href="/facts/Semiconductor_device/6W3ryr50">device</a> (<a href="/facts/P%25E2%2580%2593n_junction/CaKIdLPg">p–n junction</a>, <a href="/facts/Schottky_diode/jIYnrpYW">Schottky diode</a>, <a href="/facts/Solar_cell/3L814UCC">solar cell</a>, etc.). Some examples of semiconductor properties that could be characterized include the <a href="/facts/Depletion_width/54fB1pfE">depletion width</a>, <a href="/facts/Carrier_concentration/vvzQRhL7">carrier concentration</a>, <a href="/facts/Carrier_generation_and_recombination/2UtL6mJp">carrier generation and recombination</a> rates, <a href="/facts/Carrier_lifetime/aM4IoqvJ">carrier lifetimes</a>, defect concentration, and trap states. </p>