Reflection high-energy electron diffraction

<p>Reflection high-energy electron diffraction (RHEED) is a <a href="/facts/Analytical_technique/TfqLbFbz">technique</a> used to characterize the surface of <a href="/facts/Crystalline/e2R2mk3E">crystalline</a> materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other <a href="/facts/Material_characterization/FDzNl7B7">materials characterization</a> methods that also rely on diffraction of high-energy <a href="/facts/Electrons/L0KBo5cW">electrons</a>. <a href="/facts/Transmission_electron_microscopy/Rpr8jpCn">Transmission electron microscopy</a>, another common <a href="/facts/Electron_diffraction/IlFzQyVu">electron diffraction</a> method samples mainly the bulk of the sample due to the geometry of the system, although in special cases it can provide surface information. <a href="/facts/Low-energy_electron_diffraction/vaAuSE7k">Low-energy electron diffraction</a> (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.
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Reflection high-energy electron diffraction open-in-new

Reflection high-energy electron diffraction