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Electron channelling contrast imaging
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<p>Electron channelling contrast imaging (ECCI) is a <a href="/facts/Scanning_electron_microscope/yzK0hsSx">scanning electron microscope</a> (SEM) <a href="/facts/Diffraction/Mk80xXHT">diffraction</a> technique used in the study of defects in materials. These can be <a href="/facts/Dislocation/m1tkJYIq">dislocations</a> or <a href="/facts/Stacking_fault/nxrIYeIn">stacking faults</a> that are close to the surface of the sample, low angle <a href="/facts/Grain_boundary/3r6klMTy">grain boundaries</a> or atomic steps. Unlike the use of <a href="/facts/Transmission_electron_microscopy/Rpr8jpCn">transmission electron microscopy</a> (TEM) for the investigation of dislocations, the ECCI approach has been called a rapid and non-destructive characterisation technique </p>