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Photoemission electron microscopy
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<p>Photoemission electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a type of <a href="/facts/Electron_microscopy/XtaBktwF">electron microscopy</a> that utilizes local variations in <a href="/facts/Electron/L0KBo5cW">electron</a> emission to generate image contrast. The excitation is usually produced by <a href="/facts/Ultraviolet_light/kncBUqn5">ultraviolet light</a>, <a href="/facts/Synchrotron_radiation/mTsSKmRz">synchrotron radiation</a> or <a href="/facts/X-ray/wseP79cN">X-ray</a> sources. PEEM measures the coefficient indirectly by collecting the emitted <a href="/facts/Secondary_electron/oUXUG8ag">secondary electrons</a> generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with <a href="/facts/Low-energy_electron_diffraction/vaAuSE7k">low-energy electron diffraction</a> (LEED), and <a href="/facts/Low-energy_electron_microscopy/Q8sxupkE">low-energy electron microscopy</a> (<a href="/facts/LEEM/Q8sxupkE">LEEM</a>). In biology, it is called photoelectron microscopy (PEM), which fits with <a href="/facts/Photoelectron_spectroscopy/UPvrQ8zD">photoelectron spectroscopy</a> (PES), <a href="/facts/Transmission_electron_microscopy/Rpr8jpCn">transmission electron microscopy</a> (TEM), and <a href="/facts/Scanning_electron_microscopy/yzK0hsSx">scanning electron microscopy</a> (SEM). </p>